Reliability Issues in Flash-Memory-Based Solid-State Drives: Experimental Analysis, Mitigation, Recovery
Crossref DOI link: https://doi.org/10.1007/978-981-13-0599-3_9
Published Online: 2018-07-12
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cai, Yu
Ghose, Saugata
Haratsch, Erich F.
Luo, Yixin
Mutlu, Onur
License valid from 2018-01-01