Secondary Electron Yield of Nano-Thick Aluminum Oxide and its Application on MCP Detector
Crossref DOI link: https://doi.org/10.1007/978-981-13-1316-5_63
Published Online: 2018-08-08
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yan, Baojun
Liu, Shulin
Wen, Kaile
Yang, Yuzhen
Zhao, Tianchi
Wang, Peiliang
Heng, Yuekun
License valid from 2018-01-01