The Role of a Thin Aluminum Film in the Reconstruction of Silicon’s Near-Surface Layers
Crossref DOI link: https://doi.org/10.1007/978-981-13-6133-3_19
Published Online: 2019-02-09
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lys, R.
Pavlyk, B.
Slobodzyan, D.
Cebulski, J.
Kushlyk, M.
Text and Data Mining valid from 2019-01-01
Version of Record valid from 2019-01-01
Chapter History
First Online: 9 February 2019