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Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering

Crossref DOI link: https://doi.org/10.1007/978-981-13-8297-0_27

Published Online: 2019-09-20

Published Print: 2020

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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