Fault Models and Test Approaches in Reversible Logic Circuits
Crossref DOI link: https://doi.org/10.1007/978-981-13-8821-7_9
Published Online: 2019-07-28
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gaur, H. M.
Sasamal, T. N.
Singh, A. K.
Mohan, A.
Text and Data Mining valid from 2019-07-28
Chapter History
First Online: 28 July 2019