Demystifying Fractal Analysis of Thin Films: A Reference for Thin Film Deposition Processes
Crossref DOI link: https://doi.org/10.1007/978-981-15-4488-0_19
Published Online: 2020-08-21
Published Print: 2021
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mwema, F. M. http://orcid.org/0000-0001-6116-5587
Akinlabi, Esther T. http://orcid.org/0000-0002-9680-5510
Oladijo, O. P. http://orcid.org/0000-0003-1650-6244
Text and Data Mining valid from 2020-08-21
Version of Record valid from 2020-08-21
Chapter History
First Online: 21 August 2020