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nTunnel FET (nTFET) Reliability Study Against Positive Bias Temperature Instability (PBTI) for Different Device Architectures

Crossref DOI link: https://doi.org/10.1007/978-981-15-5546-6_14

Published Online: 2020-09-20

Published Print: 2021

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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