Analysing the Behaviour of 14 nm, 10 nm, 7 nm FinFET and Predicting the Superiority Among the Lot
Crossref DOI link: https://doi.org/10.1007/978-981-16-2911-2_2
Published Online: 2021-08-31
Published Print: 2022
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sen, Soumya
Singh, Mandeep
Text and Data Mining valid from 2021-08-31
Version of Record valid from 2021-08-31
Chapter History
First Online: 31 August 2021