Document is current

Any future updates will be listed below

Effect of Gate Dielectric Thickness on the Performance of Top-Down ZnO Nanowire Field-Effect Transistors

Crossref DOI link: https://doi.org/10.1007/978-981-16-8129-5_105

Published Online: 2022-02-11

Published Print: 2022

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark