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Design and Temperature Analysis of Si0.8Ge0.2-Based Extended Gate Gate-All-Around TFET

Crossref DOI link: https://doi.org/10.1007/978-981-19-2308-1_4

Published Online: 2022-09-12

Published Print: 2023

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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