Gaussian Scale Concept to Reduce the Computation in Detection of Surface Defects in Machine Vision
Crossref DOI link: https://doi.org/10.1007/978-981-19-4044-6_14
Published Online: 2022-11-10
Published Print: 2022
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Satheesh, P.
Srinivas, B.
Rama Santosh Naidu, P.
Text and Data Mining valid from 2022-01-01
Version of Record valid from 2022-01-01
Chapter History
First Online: 10 November 2022