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Analysis of Threshold Voltage and Subthreshold Behaviour for 400 NM Gate of Ultrathin Nanoscale FD SOI MOSFET

Crossref DOI link: https://doi.org/10.1007/978-981-33-4501-0_76

Published Online: 2021-04-21

Published Print: 2021

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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