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Evaluation of the Transfer Learning Models in Wafer Defects Classification

Crossref DOI link: https://doi.org/10.1007/978-981-33-4597-3_78

Published Online: 2021-07-16

Published Print: 2022

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Mat Jizat, Jessnor Arif https://orcid.org/0000-0003-4151-5302
Abdul Majeed, Anwar P. P. https://orcid.org/0000-0002-3094-5596
Ab. Nasir, Ahmad Fakhri https://orcid.org/0000-0002-8278-6451
Taha, Zahari

Yuen, Edmund

Lim, Shi Xuen
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Text and Data Mining valid from 2021-07-16

Version of Record valid from 2021-07-16
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Chapter History

First Online: 16 July 2021