Document is current

Any future updates will be listed below

Shallow- and deep-levels analysis in irradiated medium-resistivity silicon detectors

Crossref DOI link: https://doi.org/10.1007/BF03185601

Published Online: 2016-01-09

Published Print: 1999-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark