Interferometric Measurement of Thickness of Isolated Transparent Films
Crossref DOI link: https://doi.org/10.1007/BF03354669
Published Online: 2015-04-30
Published Print: 2000-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Saha, Satadal
Bhattacharya, Kallol
Text and Data Mining valid from 2000-03-01