Interferometric Measurement of Thickness of Thin Films of Formvar Deposited on Glass Plates
Crossref DOI link: https://doi.org/10.1007/BF03354675
Published Online: 2015-04-30
Published Print: 2000-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shukla, R. P.
Kumar, Sanjiva
Chowdhury, A.
Gupta, P. D.
Text and Data Mining valid from 2000-06-01