A scaling limit for line and surface defects
Crossref DOI link: https://doi.org/10.1007/JHEP06(2022)071
Published Online: 2022-06-13
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rodriguez-Gomez, D.
Text and Data Mining valid from 2022-06-13
Version of Record valid from 2022-06-13
Article History
Received: 25 February 2022
Revised: 25 April 2022
Accepted: 16 May 2022
First Online: 13 June 2022