Appraisal of an Array TEM Method in Detecting a Mined-Out Area Beneath a Conductive Layer
Crossref DOI link: https://doi.org/10.1007/s00024-015-1075-0
Published Online: 2015-04-09
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Hai
Xue, Guo-qiang
Zhou, Nan-nan
Chen, Wei-ying
Text and Data Mining valid from 2015-04-09
