Analog Circuit Specification Testing by Means of Walsh–Hadamard Transform and Multiple Regression Supported by Evolutionary Computations
Crossref DOI link: https://doi.org/10.1007/s00034-017-0708-1
Published Online: 2017-11-20
Published Print: 2018-07
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Golonek, Tomasz http://orcid.org/0000-0001-9487-2886
Machniewski, Jan
License valid from 2017-11-20