Investigation of Extreme Learning Machine-Based Fault Diagnosis to Identify Faulty Components in Analog Circuits
Crossref DOI link: https://doi.org/10.1007/s00034-023-02526-9
Published Online: 2023-10-10
Published Print: 2024-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Biswas, Suman http://orcid.org/0000-0002-2644-1563
Mahanti, Gautam Kumar
Chattaraj, Nilanjan
Text and Data Mining valid from 2023-10-10
Version of Record valid from 2023-10-10
Article History
Received: 19 January 2023
Revised: 20 September 2023
Accepted: 20 September 2023
First Online: 10 October 2023
Declarations
:
: All the authors of the paper declare that they have no conflict of interest.