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Understanding and Measuring the Jitter Generated by Digital CMOS Gates

Crossref DOI link: https://doi.org/10.1007/s00034-024-02885-x

Published Online: 2024-10-05

Published Print: 2025-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Jenkins, Keith A. https://orcid.org/0000-0002-6949-8439
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Text and Data Mining valid from 2024-10-05

Version of Record valid from 2024-10-05
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Article History

Received: 24 April 2024

Revised: 23 September 2024

Accepted: 24 September 2024

First Online: 5 October 2024