Study on chip failure mechanism in high-speed cutting process with electronic theory
Crossref DOI link: https://doi.org/10.1007/s00170-015-7852-1
Published Online: 2015-09-26
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Jin-quan
Zhang, Rui
Guo, Hai-lin
Zhang, Zhi-jun
Text and Data Mining valid from 2015-09-26