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An improved adaptive sampling strategy for freeform surface inspection on CMM

Crossref DOI link: https://doi.org/10.1007/s00170-018-1612-y

Published Online: 2018-01-20

Published Print: 2018-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

He, Gaiyun

Sang, Yicun

Pang, Kairui

Sun, Guangming
License Information

Text and Data Mining valid from 2018-01-20
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Article History

Received: 26 July 2017

Accepted: 10 January 2018

First Online: 20 January 2018

Change Date: 27 February 2018

Change Type: Correction

Change Details: The original version of this article contained a mistake. Yincun Sang has been corrected to Yicun Sang. The presentation is corrected above.