A new grey prediction model for the return material authorization process in the TFT-LCD industry
Crossref DOI link: https://doi.org/10.1007/s00170-018-1754-y
Published Online: 2018-02-19
Published Print: 2018-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Der-Chiang
Yeh, Chun-Wu http://orcid.org/0000-0003-1936-9767
Chen, Chien-Chih
Wang, Yung-Tai
Text and Data Mining valid from 2018-02-19
Article History
Received: 18 October 2017
Accepted: 7 February 2018
First Online: 19 February 2018