SMT defect classification by feature extraction region optimization and machine learning
Crossref DOI link: https://doi.org/10.1007/s00170-018-3022-6
Published Online: 2018-11-17
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Song, Ji-Deok
Kim, Young-Gyu
Park, Tae-Hyoung
Text and Data Mining valid from 2018-11-17
Article History
Received: 1 June 2018
Accepted: 11 November 2018
First Online: 17 November 2018