Computer vision measurement system for standards calibration in XY plane with sub-micrometer accuracy
Crossref DOI link: https://doi.org/10.1007/s00170-019-04297-7
Published Online: 2019-09-13
Published Print: 2019-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Costa, Pedro Bastos
Leta, Fabiana Rodrigues
de Oliveira Baldner, Felipe
Text and Data Mining valid from 2019-09-13
Version of Record valid from 2019-09-13
Article History
Received: 6 May 2019
Accepted: 13 August 2019
First Online: 13 September 2019