Determination of a process window with consideration of effective layer thickness in SLM process
Crossref DOI link: https://doi.org/10.1007/s00170-019-04402-w
Published Online: 2019-10-28
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ahn, Il Hyuk
Funding for this research was provided by:
Tongmyong University (2017A002-1)
Text and Data Mining valid from 2019-10-28
Version of Record valid from 2019-10-28
Article History
Received: 3 September 2018
Accepted: 6 September 2019
First Online: 28 October 2019