Resolving measurement ambiguity in diffractive image microscopy for 6DOF surface measurement using designed aberration and multiple-layer perceptron
Crossref DOI link: https://doi.org/10.1007/s00170-023-11147-0
Published Online: 2023-03-01
Published Print: 2023-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wu, Guo-Wei
Chen, Liang-Chia
Text and Data Mining valid from 2023-03-01
Version of Record valid from 2023-03-01
Article History
Received: 27 November 2022
Accepted: 21 February 2023
First Online: 1 March 2023
Declarations
:
: Not available.
: The authors declare no competing interests.