Enhancing the effectiveness of output projection in wafer fabrication using an Industry 4.0 and XAI approach
Crossref DOI link: https://doi.org/10.1007/s00170-024-14105-6
Published Online: 2024-07-16
Published Print: 2024-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Tin-Chih Toly
Wang, Yu-Cheng https://orcid.org/0000-0003-4339-1665
Lin, Chi-Wei
Text and Data Mining valid from 2024-07-16
Version of Record valid from 2024-07-16
Article History
Received: 7 March 2024
Accepted: 3 July 2024
First Online: 16 July 2024
Declarations
:
: Not required.
: The authors declare no competing interests.