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Unsupervised fault detection in automated sequential manufacturing processes through image analysis and convolutional LSTM-based next visual status prediction

Crossref DOI link: https://doi.org/10.1007/s00170-024-14413-x

Published Online: 2024-09-12

Published Print: 2024-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Yu, Na Hyeon

Baek, Sujeong
Funding

Funding for this research was provided by:

National Research Foundation of Korea (NRF-2022R1F1A1069296)
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Text and Data Mining valid from 2024-09-12

Version of Record valid from 2024-09-12
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Article History

Received: 29 April 2024

Accepted: 5 September 2024

First Online: 12 September 2024

Declarations

:

: The authors declare no competing interests.

: The founding sponsors had no role in the design of the study; in the collection, analyses, or interpretation of data; in the writing of the manuscript, and in the decision to publish the results.

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