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Recognition and ranking using similarity on defective wafer bin maps

Published Online: 2025-05-10

Published Print: 2025-05

Authors

Kwon, YoungWook

Oh, SuMin

Kim, HyunJin https://orcid.org/0000-0001-5017-3995
Funding

Funding for this research was provided by:

SK Hynix
License Information

Text and Data Mining valid from 2025-05-01

Version of Record valid from 2025-05-01
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Article History

Received: 2 November 2024

Accepted: 5 May 2025

First Online: 10 May 2025

Declarations

:

: The authors declare no competing interests.

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