Crossmark

Combining residual network and bidirectional long short-term memory with additive attention for wafer defect classification

Published Online: 2025-11-15

Published Print: 2025-12

Authors

Kang, Gyumin

Lee, Gyucheol

Kim, Younghoon https://orcid.org/0000-0003-0265-3825
Funding

Funding for this research was provided by:

Korea Institute of Energy Technology Evaluation and Planning (RS-2023-00244330)

National Research Foundation of Korea (RS-2023-00219052; RS-2024-00352587)
License Information

Text and Data Mining valid from 2025-11-15

Version of Record valid from 2025-11-15
More Information

Article History

Received: 4 July 2025

Accepted: 1 November 2025

First Online: 15 November 2025

Declarations

:

: Ethical approval is not required for this study.

: Not applicable.

: Manuscript is approved by all authors for publication.

: The authors declare no competing interests.

Document is current