Failure mode and effects analysis of power quality issues and their influence in the reliability of electronic products
Crossref DOI link: https://doi.org/10.1007/s00202-016-0399-9
Published Online: 2016-08-17
Published Print: 2017-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Méndez-González, Luis Carlos http://orcid.org/0000-0002-2533-0036
Ambrosio-Lazaro, Roberto
Rodríguez-Borbon, Iván
Alvarado-Iniesta, Alejandro
License valid from 2016-08-17