i-Motif DNA structures upon electric field exposure: completing the map of induced genetic errors
Crossref DOI link: https://doi.org/10.1007/s00214-019-2423-4
Published Online: 2019-02-05
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cerón-Carrasco, José P. http://orcid.org/0000-0003-0668-9227
Jacquemin, Denis
Text and Data Mining valid from 2019-02-05
Article History
Received: 29 November 2018
Accepted: 30 January 2019
First Online: 5 February 2019