Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards
Crossref DOI link: https://doi.org/10.1007/s00216-014-8135-7
Published Online: 2014-09-12
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Senoner, M.
Maaßdorf, A.
Rooch, H.
Österle, W.
Malcher, M.
Schmidt, M.
Kollmer, F.
Paul, D.
Hodoroaba, V.-D.
Rades, S.
Unger, W. E. S.
Text and Data Mining valid from 2014-09-12