New reference and test materials for the characterization of energy dispersive X-ray spectrometers at scanning electron microscopes
Crossref DOI link: https://doi.org/10.1007/s00216-014-8242-5
Published Online: 2014-10-19
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rackwitz, Vanessa
Krumrey, Michael
Laubis, Christian
Scholze, Frank
Hodoroaba, Vasile-Dan
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