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Erratum to: Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards

Crossref DOI link: https://doi.org/10.1007/s00216-015-8501-0

Published Online: 2015-02-21

Published Print: 2015-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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