Electronic and local atomistic structure of MgSiO3 glass under pressure: a study of X-ray Raman scattering at the silicon and magnesium L-edges
Crossref DOI link: https://doi.org/10.1007/s00269-017-0909-y
Published Online: 2017-06-29
Published Print: 2018-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fukui, Hiroshi https://orcid.org/0000-0002-7880-635X
Hiraoka, Nozomu
License valid from 2017-06-29