Effects of contact resistance on the evaluation of charge carrier mobilities and transport parameters in amorphous zinc tin oxide thin-film transistors
Crossref DOI link: https://doi.org/10.1007/s00339-014-8422-3
Published Online: 2014-04-23
Published Print: 2014-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Schulz, Leander
Yun, Eui-Jung
Dodabalapur, Ananth
Text and Data Mining valid from 2014-04-23