Focused-electron-beam-induced processing (FEBIP) for emerging applications in carbon nanoelectronics
Crossref DOI link: https://doi.org/10.1007/s00339-014-8628-4
Published Online: 2014-07-27
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fedorov, Andrei G.
Kim, Songkil
Henry, Mathias
Kulkarni, Dhaval
Tsukruk, Vladimir V.
Text and Data Mining valid from 2014-07-27