Variability of electrical contact properties in multilayer MoS2 thin-film transistors
Crossref DOI link: https://doi.org/10.1007/s00339-014-8785-5
Published Online: 2014-09-23
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Seong Yeoul
Park, Seonyoung
Choi, Woong
Text and Data Mining valid from 2014-09-23
