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Interface modulation and resistive switching evolution in Pt/NiO x /Al2O3/n+–Si structure

Crossref DOI link: https://doi.org/10.1007/s00339-014-8889-y

Published Online: 2014-11-20

Published Print: 2015-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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