Distinction between amorphous and crystalline silicon by means of electron energy-loss spectroscopy
Crossref DOI link: https://doi.org/10.1007/s00339-015-9201-5
Published Online: 2015-04-29
Published Print: 2015-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Schade, Martin
Fuhrmann, Bodo
Chassé, Angelika
Heyroth, Frank
Roczen, Maurizio
Leipner, Hartmut S.
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