Investigation of the annealing effects on the structural and optoelectronic properties of RF-sputtered ZnO films studied by the Drude–Lorentz model
Crossref DOI link: https://doi.org/10.1007/s00339-015-9318-6
Published Online: 2015-07-03
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
García-Méndez, Manuel
Bedoya-Calle, Álvaro
Segura, Ricardo Rangel
Coello, Víctor
Funding for this research was provided by:
CONACyT (168234)
PAICyT (CE671-11)
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