Correlation between interface modification and rectifying behavior of p-type Cu2ZnSnS4/n-type Si diodes
Crossref DOI link: https://doi.org/10.1007/s00339-015-9390-y
Published Online: 2015-07-30
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lin, Yow-Jon
Ruan, Cheng-He
Chu, Yu-Ju
Liu, Chia-Jyi
Lin, Fei-Hung
Funding for this research was provided by:
Ministry of Science and Technology, Taiwan (103-2112-M-018-003-MY3)
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