Scanning thermal microscopy of Bi2Te3 and Yb0.19Co4Sb12 thermoelectric films
Crossref DOI link: https://doi.org/10.1007/s00339-016-0017-8
Published Online: 2016-03-31
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zeipl, Radek
Jelínek, Miroslav
Vaniš, Jan
Remsa, Jan
Kocourek, Tomáš
Navrátil, Jiří
Funding for this research was provided by:
Czech Grant Agency (P108/13-33056S)
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