Raman scattering and electrical studies of the phase stability in the Hg1−xCdxTe
Crossref DOI link: https://doi.org/10.1007/s00339-016-0080-1
Published Online: 2016-04-26
Published Print: 2016-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Singh, Anand
Shukla, A. K.
Pal, R.
Text and Data Mining valid from 2016-04-26
