Crossmark

Auger electron spectroscopy study and depth profile analyses of the CaS:Eu2+ pulsed laser deposited thin luminescent films

Crossref DOI link: https://doi.org/10.1007/s00339-016-0135-3

Published Online: 2016-05-30

Published Print: 2016-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Nyenge, R. L.

Swart, H. C.

Ntwaeaborwa, O. M. https://orcid.org/0000-0002-7259-0594
Funding

Funding for this research was provided by:

National Research Foundation (CPR20110724000021870)

Council for Scientific and Industrial Research (NLC-LREGM00-CON-001)

Department of Science and Technology, Republic of South Africa (84415)
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