Influence of gate metal engineering on small-signal and noise behaviour of silicon nanowire MOSFET for low-noise amplifiers
Crossref DOI link: https://doi.org/10.1007/s00339-016-0239-9
Published Online: 2016-07-05
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gupta, Neha
Chaujar, Rishu
License valid from 2016-07-05
