X-ray diffraction line profile analysis of KBr thin films
Crossref DOI link: https://doi.org/10.1007/s00339-016-0293-3
Published Online: 2016-07-30
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rai, R.
Triloki, Triloki
Singh, B. K.
License valid from 2016-07-30
